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Wafer inspection platform uses AI for AOI function

At next month’s Semicon Taiwan, Test Research (TRI) will exhibit its TR7950Q SII wafer inspection platform.  unveils AI powers AOI inspection The test and inspection systems provider offers the AI-powered AOI machines for the semiconductor and advanced packaging industry. They can inspect die and wire bonding, wafer surface and bumps, epoxy and foreign material detection. […]

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