Effect of Burn-in Process on X7R MLCC Reliability

Effect of Burn-in Process on X7R MLCC Reliability

Effect of Burn-in Process on X7R MLCC Reliability

The scientific paper on evaluation of effect of burn-in process on reliability of X7R multilayer ceramic capacitors has been published by Penn State researchers. Base metal electrode (BME) multilayer ceramic capacitors (MLCCs) continue to advance with higher volumetric capacitance, higher voltage, and higher temperature operational ranges with greater numbers of capacitors being manufactured and integrated […]

Read the original post Effect of Burn-in Process on X7R MLCC Reliability on Passive Components Blog.

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